Configurable Large Envelope Systems

Nikon Metrology’s large-envelope X-ray and CT scanning systems offer industry-leading X-ray technology, ultra-precise manipulator design, intuitive software and advanced scanning modes to produce the most capable standard CT systems available. With a large inspection volume, these systems support multiple sources and detectors and can be custom-configured to suit a variety of applications in aerospace, automotive, manufacturing, electronics, castings, plastics, consumer products and much more. Precision X-ray and CT scanning allows applications such as reverse engineering, part-to-CAD comparison, detailed failure analysis, advanced materials and biological structure research, digital archiving and much more.

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