XT V 130 / XT V 160

The XT V system range comprises world-class X-ray and CT inspection systems of advanced, ergonomic design, meeting today’s need for high performance inspection of increasingly complex components with ever tighter tolerances.

The systems are intuitive to use and harness industry-leading software to maximise productivity for all operators, with minimal need for training. Automated inspection modes allow inspection of samples at high throughput rates, with intuitive pass / fail reporting.

With sub-micron feature recognition, XT V inspection systems are applicable to a wide range of applications and industries including PCB assembly, BGA inspection, chip design, medical and automotive component manufacturing, aerospace, consumer products and much more.

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Opprett mikroskop

Vi oppretter alt i fra student mikroskop til avanserte forskningsmikroskop.

NIS-Elements bildeanalyse

Programvare til Nikon kamera og mikroskop som kan styre alt.

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